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An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits
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| Zeitschriftentitel: | Scanning |
|---|---|
| Personen und Körperschaften: | , , , , , |
| In: | Scanning, 8, 1986, 1, S. 20-33 |
| Format: | E-Article |
| Sprache: | Englisch |
| veröffentlicht: |
Wiley
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| Schlagwörter: |
| author_facet |
Canali, C. Fantini, F. Giannini, M. Senin, A. Vanzi, M. Zanoni, E. Canali, C. Fantini, F. Giannini, M. Senin, A. Vanzi, M. Zanoni, E. |
|---|---|
| author |
Canali, C. Fantini, F. Giannini, M. Senin, A. Vanzi, M. Zanoni, E. |
| spellingShingle |
Canali, C. Fantini, F. Giannini, M. Senin, A. Vanzi, M. Zanoni, E. Scanning An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits Instrumentation Atomic and Molecular Physics, and Optics |
| author_sort |
canali, c. |
| spelling |
Canali, C. Fantini, F. Giannini, M. Senin, A. Vanzi, M. Zanoni, E. 0161-0457 1932-8745 Wiley Instrumentation Atomic and Molecular Physics, and Optics http://dx.doi.org/10.1002/sca.4950080105 <jats:title>Abstract</jats:title><jats:p>An electron beam testing system was established for a complete and detailed analysis of latch‐up in CMOS integrated circuits. Problems which can be studied include: <jats:list list-type="explicit-label"> <jats:list-item><jats:p>identification of latch‐up current paths in steady state condition;</jats:p></jats:list-item> <jats:list-item><jats:p>measurement of the local latch‐up sensitivity of the various parts of the circuit;</jats:p></jats:list-item> <jats:list-item><jats:p>observation of the time evolution of latch‐up from the firing event to the final condition.</jats:p></jats:list-item> </jats:list></jats:p> An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits Scanning |
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10.1002/sca.4950080105 |
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Allgemeines Technik Physik |
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Wiley, 1986 |
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Wiley, 1986 |
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0161-0457 1932-8745 |
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0161-0457 1932-8745 |
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1986 |
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Wiley |
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| title |
An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_unstemmed |
An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_full |
An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_fullStr |
An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_full_unstemmed |
An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_short |
An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_sort |
an sem based system for a complete characterization of latch‐up in cmos integrated circuits |
| topic |
Instrumentation Atomic and Molecular Physics, and Optics |
| url |
http://dx.doi.org/10.1002/sca.4950080105 |
| publishDate |
1986 |
| physical |
20-33 |
| description |
<jats:title>Abstract</jats:title><jats:p>An electron beam testing system was established for a complete and detailed analysis of latch‐up in CMOS integrated circuits. Problems which can be studied include: <jats:list list-type="explicit-label">
<jats:list-item><jats:p>identification of latch‐up current paths in steady state condition;</jats:p></jats:list-item>
<jats:list-item><jats:p>measurement of the local latch‐up sensitivity of the various parts of the circuit;</jats:p></jats:list-item>
<jats:list-item><jats:p>observation of the time evolution of latch‐up from the firing event to the final condition.</jats:p></jats:list-item>
</jats:list></jats:p> |
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| author | Canali, C., Fantini, F., Giannini, M., Senin, A., Vanzi, M., Zanoni, E. |
| author_facet | Canali, C., Fantini, F., Giannini, M., Senin, A., Vanzi, M., Zanoni, E., Canali, C., Fantini, F., Giannini, M., Senin, A., Vanzi, M., Zanoni, E. |
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| description | <jats:title>Abstract</jats:title><jats:p>An electron beam testing system was established for a complete and detailed analysis of latch‐up in CMOS integrated circuits. Problems which can be studied include: <jats:list list-type="explicit-label"> <jats:list-item><jats:p>identification of latch‐up current paths in steady state condition;</jats:p></jats:list-item> <jats:list-item><jats:p>measurement of the local latch‐up sensitivity of the various parts of the circuit;</jats:p></jats:list-item> <jats:list-item><jats:p>observation of the time evolution of latch‐up from the firing event to the final condition.</jats:p></jats:list-item> </jats:list></jats:p> |
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| id | ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTAwMi9zY2EuNDk1MDA4MDEwNQ |
| imprint | Wiley, 1986 |
| imprint_str_mv | Wiley, 1986 |
| institution | DE-D275, DE-Bn3, DE-Brt1, DE-Zwi2, DE-D161, DE-Zi4, DE-Gla1, DE-15, DE-Pl11, DE-Rs1, DE-14, DE-105, DE-Ch1, DE-L229 |
| issn | 0161-0457, 1932-8745 |
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| language | English |
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| physical | 20-33 |
| publishDate | 1986 |
| publishDateSort | 1986 |
| publisher | Wiley |
| record_format | ai |
| recordtype | ai |
| series | Scanning |
| source_id | 49 |
| spelling | Canali, C. Fantini, F. Giannini, M. Senin, A. Vanzi, M. Zanoni, E. 0161-0457 1932-8745 Wiley Instrumentation Atomic and Molecular Physics, and Optics http://dx.doi.org/10.1002/sca.4950080105 <jats:title>Abstract</jats:title><jats:p>An electron beam testing system was established for a complete and detailed analysis of latch‐up in CMOS integrated circuits. Problems which can be studied include: <jats:list list-type="explicit-label"> <jats:list-item><jats:p>identification of latch‐up current paths in steady state condition;</jats:p></jats:list-item> <jats:list-item><jats:p>measurement of the local latch‐up sensitivity of the various parts of the circuit;</jats:p></jats:list-item> <jats:list-item><jats:p>observation of the time evolution of latch‐up from the firing event to the final condition.</jats:p></jats:list-item> </jats:list></jats:p> An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits Scanning |
| spellingShingle | Canali, C., Fantini, F., Giannini, M., Senin, A., Vanzi, M., Zanoni, E., Scanning, An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits, Instrumentation, Atomic and Molecular Physics, and Optics |
| title | An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_full | An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_fullStr | An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_full_unstemmed | An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_short | An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| title_sort | an sem based system for a complete characterization of latch‐up in cmos integrated circuits |
| title_unstemmed | An SEM based system for a complete characterization of latch‐up in CMOS integrated circuits |
| topic | Instrumentation, Atomic and Molecular Physics, and Optics |
| url | http://dx.doi.org/10.1002/sca.4950080105 |