author_facet Ng, F C
Abas, A
Abdullah, M Z
Ng, F C
Abas, A
Abdullah, M Z
author Ng, F C
Abas, A
Abdullah, M Z
spellingShingle Ng, F C
Abas, A
Abdullah, M Z
IOP Conference Series: Materials Science and Engineering
Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
author_sort ng, f c
spelling Ng, F C Abas, A Abdullah, M Z 1757-8981 1757-899X IOP Publishing http://dx.doi.org/10.1088/1757-899x/530/1/012012 <jats:title>Abstract</jats:title> <jats:p>Three distinct flip-chip underfill cases were considered in this work, with each possess a bump pitch of 0.8 mm, 1.0 mm and 1.2 mm. Contact line jump (CLJ) phenomenon during the underfill flow were successfully visualized with the aided of finite volume method (FVM) based simulation. The current simulated underfill flow fronts were qualitatively validated with the existing experimental data. Generally, the attachment process occurs much faster than the detachment process, by a factor of 14. Within the investigated pitches range, shorter bump pitch would yield a slower underfill flow but a faster-completion underfill process. The voiding mechanism during the underfill process were presented. Furthermore, the dynamic contact angle of underfill meniscus were analytically computed from the numerical data. The contact angle is found to be varies sinusoidally with the filling time, while the impact of bump pitch is minimal. Lastly, it is found that the bump pitch of flip-chip does affect the void formation and propagation.</jats:p> Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches IOP Conference Series: Materials Science and Engineering
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series IOP Conference Series: Materials Science and Engineering
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title Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_unstemmed Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_full Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_fullStr Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_full_unstemmed Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_short Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_sort finite volume method study on contact line jump phenomena and dynamic contact angle of underfill flow in flip-chip of various bump pitches
url http://dx.doi.org/10.1088/1757-899x/530/1/012012
publishDate 2019
physical 012012
description <jats:title>Abstract</jats:title> <jats:p>Three distinct flip-chip underfill cases were considered in this work, with each possess a bump pitch of 0.8 mm, 1.0 mm and 1.2 mm. Contact line jump (CLJ) phenomenon during the underfill flow were successfully visualized with the aided of finite volume method (FVM) based simulation. The current simulated underfill flow fronts were qualitatively validated with the existing experimental data. Generally, the attachment process occurs much faster than the detachment process, by a factor of 14. Within the investigated pitches range, shorter bump pitch would yield a slower underfill flow but a faster-completion underfill process. The voiding mechanism during the underfill process were presented. Furthermore, the dynamic contact angle of underfill meniscus were analytically computed from the numerical data. The contact angle is found to be varies sinusoidally with the filling time, while the impact of bump pitch is minimal. Lastly, it is found that the bump pitch of flip-chip does affect the void formation and propagation.</jats:p>
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author Ng, F C, Abas, A, Abdullah, M Z
author_facet Ng, F C, Abas, A, Abdullah, M Z, Ng, F C, Abas, A, Abdullah, M Z
author_sort ng, f c
container_issue 1
container_start_page 0
container_title IOP Conference Series: Materials Science and Engineering
container_volume 530
description <jats:title>Abstract</jats:title> <jats:p>Three distinct flip-chip underfill cases were considered in this work, with each possess a bump pitch of 0.8 mm, 1.0 mm and 1.2 mm. Contact line jump (CLJ) phenomenon during the underfill flow were successfully visualized with the aided of finite volume method (FVM) based simulation. The current simulated underfill flow fronts were qualitatively validated with the existing experimental data. Generally, the attachment process occurs much faster than the detachment process, by a factor of 14. Within the investigated pitches range, shorter bump pitch would yield a slower underfill flow but a faster-completion underfill process. The voiding mechanism during the underfill process were presented. Furthermore, the dynamic contact angle of underfill meniscus were analytically computed from the numerical data. The contact angle is found to be varies sinusoidally with the filling time, while the impact of bump pitch is minimal. Lastly, it is found that the bump pitch of flip-chip does affect the void formation and propagation.</jats:p>
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spelling Ng, F C Abas, A Abdullah, M Z 1757-8981 1757-899X IOP Publishing http://dx.doi.org/10.1088/1757-899x/530/1/012012 <jats:title>Abstract</jats:title> <jats:p>Three distinct flip-chip underfill cases were considered in this work, with each possess a bump pitch of 0.8 mm, 1.0 mm and 1.2 mm. Contact line jump (CLJ) phenomenon during the underfill flow were successfully visualized with the aided of finite volume method (FVM) based simulation. The current simulated underfill flow fronts were qualitatively validated with the existing experimental data. Generally, the attachment process occurs much faster than the detachment process, by a factor of 14. Within the investigated pitches range, shorter bump pitch would yield a slower underfill flow but a faster-completion underfill process. The voiding mechanism during the underfill process were presented. Furthermore, the dynamic contact angle of underfill meniscus were analytically computed from the numerical data. The contact angle is found to be varies sinusoidally with the filling time, while the impact of bump pitch is minimal. Lastly, it is found that the bump pitch of flip-chip does affect the void formation and propagation.</jats:p> Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches IOP Conference Series: Materials Science and Engineering
spellingShingle Ng, F C, Abas, A, Abdullah, M Z, IOP Conference Series: Materials Science and Engineering, Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_full Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_fullStr Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_full_unstemmed Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_short Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
title_sort finite volume method study on contact line jump phenomena and dynamic contact angle of underfill flow in flip-chip of various bump pitches
title_unstemmed Finite Volume Method Study on Contact Line Jump Phenomena and Dynamic Contact Angle of Underfill Flow in Flip-Chip of Various Bump Pitches
url http://dx.doi.org/10.1088/1757-899x/530/1/012012