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Feature adaptive sampling for scanning electron microscopy
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| Veröffentlicht in: | Scientific reports 6(2016), Seite 25350 |
|---|---|
| Personen und Körperschaften: | , , , , , , , |
| Titel: | Feature adaptive sampling for scanning electron microscopy/ Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek |
| Format: | E-Book-Kapitel |
| Sprache: | Englisch |
| veröffentlicht: |
2016
|
| Gesamtaufnahme: |
: Scientific reports, 6(2016), Seite 25350
, volume:6 |
| Quelle: | Verbunddaten SWB Lizenzfreie Online-Ressourcen |
| LEADER | 02545caa a2200613 4500 | ||
|---|---|---|---|
| 001 | 0-1543896928 | ||
| 003 | DE-627 | ||
| 005 | 20190926150616.0 | ||
| 007 | cr uuu---uuuuu | ||
| 008 | 160711s2016 xx |||||o 00| ||eng c | ||
| 035 | |a (DE-627)1543896928 | ||
| 035 | |a (DE-576)473896923 | ||
| 035 | |a (DE-599)BSZ473896923 | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rda | ||
| 041 | |a eng | ||
| 100 | 1 | |a Dahmen, Tim |e VerfasserIn |4 aut | |
| 245 | 1 | 0 | |a Feature adaptive sampling for scanning electron microscopy |c Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek |
| 264 | 1 | |c 2016 | |
| 300 | |a Online-Ressource | ||
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a Computermedien |b c |2 rdamedia | ||
| 338 | |a Online-Ressource |b cr |2 rdacarrier | ||
| 700 | 1 | |a Engstler, Michael |e VerfasserIn |4 aut | |
| 700 | 1 | |a Pauly, Christoph |e VerfasserIn |4 aut | |
| 700 | 1 | |a Trampert, Patrick |e VerfasserIn |4 aut | |
| 700 | 1 | |a Jonge, Niels de |e VerfasserIn |0 (DE-588)121263444 |0 (DE-627)730127443 |0 (DE-576)181343908 |4 aut | |
| 700 | 1 | |a Mücklich, Frank |d 1959- |e VerfasserIn |0 (DE-588)1115732455 |0 (DE-627)869923625 |0 (DE-576)477892973 |4 aut | |
| 700 | 1 | |a Slusallek, Philipp |d 1963- |e VerfasserIn |0 (DE-588)173023452 |0 (DE-627)697948358 |0 (DE-576)133876411 |4 aut | |
| 710 | 2 | |a Leibniz-Institut für Neue Materialien |e GeistigeR SchöpferIn |0 (DE-588)10123313-9 |0 (DE-627)50534226X |0 (DE-576)250343517 |4 cre | |
| 773 | 0 | 8 | |i Enthalten in |t Scientific reports |d [London] : Macmillan Publishers Limited, part of Springer Nature, 2011 |g 6(2016), Seite 25350 |h Online-Ressource |w (DE-627)663366712 |w (DE-600)2615211-3 |w (DE-576)346641179 |x 2045-2322 |7 nnns |
| 773 | 1 | 8 | |g volume:6 |g year:2016 |g pages:25350 |
| 856 | 4 | 0 | |u http://dx.doi.org/10.1038/srep25350 |x Verlag |z kostenfrei |3 Volltext |
| 936 | u | w | |d 6 |j 2016 |h 25350 |
| 951 | |a AR | ||
| 856 | 4 | 0 | |u http://dx.doi.org/10.1038/srep25350 |9 LFER |
| 852 | |a LFER |z 2016-10-10T00:00:00Z | ||
| 970 | |c OD | ||
| 971 | |c EBOOK | ||
| 972 | |c EBOOK | ||
| 973 | |c Aufsatz | ||
| 935 | |a lfer | ||
| 900 | |a Jonge, N. de | ||
| 900 | |a De Jonge, Niels | ||
| 900 | |a De Jonge, N. | ||
| 900 | |a DeJonge, Niels | ||
| 900 | |a DeJonge, N. | ||
| 910 | |a Leibniz-Institut für Neue Materialien gGmbH | ||
| 910 | |a Leibniz Institute for New Materials | ||
| 910 | |a Institut für Neue Materialien | ||
| 910 | |a Leibniz-Institut für Neue Materialien | ||
| 910 | |a Institute for New Materials | ||
| 910 | |a INM GmbH | ||
| 910 | |a INM | ||
| 980 | |a 1543896928 |b 0 |k 1543896928 |o 473896923 |c lfer | ||
| openURL |
url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fvufind.svn.sourceforge.net%3Agenerator&rft.title=Feature+adaptive+sampling+for+scanning+electron+microscopy&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rft.creator=Dahmen%2C+Tim&rft.pub=&rft.format=Journal&rft.language=English&rft.issn=2045-2322 |
|---|
| _version_ | 1757947637151039488 |
|---|---|
| access_facet | Electronic Resources |
| author | Dahmen, Tim, Engstler, Michael, Pauly, Christoph, Trampert, Patrick, Jonge, Niels de, Mücklich, Frank, Slusallek, Philipp |
| author_corporate | Leibniz-Institut für Neue Materialien |
| author_corporate_role | cre |
| author_facet | Dahmen, Tim, Engstler, Michael, Pauly, Christoph, Trampert, Patrick, Jonge, Niels de, Mücklich, Frank, Slusallek, Philipp, Leibniz-Institut für Neue Materialien |
| author_role | aut, aut, aut, aut, aut, aut, aut |
| author_sort | Dahmen, Tim |
| author_variant | t d td, m e me, c p cp, p t pt, n d j nd ndj, f m fm, p s ps |
| callnumber-sort | |
| collection | lfer |
| container_reference | 6(2016), Seite 25350 |
| container_title | Scientific reports |
| ctrlnum | (DE-627)1543896928, (DE-576)473896923, (DE-599)BSZ473896923 |
| facet_avail | Online, Free |
| finc_class_facet | not assigned |
| finc_id_str | 0017986160 |
| format | ElectronicBookComponentPart |
| format_access_txtF_mv | Article, E-Article |
| format_de105 | Ebook |
| format_de14 | Article, E-Article |
| format_de15 | Article, E-Article |
| format_del152 | Buch |
| format_detail_txtF_mv | text-online-monograph-child |
| format_dezi4 | e-Book |
| format_finc | Article, E-Article |
| format_legacy | ElectronicBookPart |
| format_strict_txtF_mv | E-Article |
| geogr_code | not assigned |
| geogr_code_person | not assigned |
| hierarchy_parent_id | 0-663366712 |
| hierarchy_parent_title | Scientific reports |
| hierarchy_sequence | 6(2016), Seite 25350 |
| hierarchy_top_id | 0-663366712 |
| hierarchy_top_title | Scientific reports |
| id | 0-1543896928 |
| illustrated | Not Illustrated |
| imprint | 2016 |
| imprint_str_mv | 2016 |
| institution | DE-D117, DE-105, LFER, DE-Ch1, DE-15, DE-14, DE-Zwi2 |
| is_hierarchy_id | 0-1543896928 |
| is_hierarchy_title | Feature adaptive sampling for scanning electron microscopy |
| isil_str_mv | LFER |
| issn | 2045-2322 |
| kxp_id_str | 1543896928 |
| language | English |
| last_indexed | 2023-02-16T01:05:10.431Z |
| match_str | dahmen2016featureadaptivesamplingforscanningelectronmicroscopy |
| mega_collection | Verbunddaten SWB, Lizenzfreie Online-Ressourcen |
| misc_de105 | EBOOK |
| multipart_link | 346641179 |
| multipart_part | (346641179)6(2016), Seite 25350 |
| names_id_str_mv | (DE-588)121263444, (DE-627)730127443, (DE-576)181343908, (DE-588)1115732455, (DE-627)869923625, (DE-576)477892973, (DE-588)173023452, (DE-627)697948358, (DE-576)133876411, (DE-588)10123313-9, (DE-627)50534226X, (DE-576)250343517 |
| physical | Online-Ressource |
| publishDate | 2016 |
| publishDateSort | 2016 |
| publishPlace | |
| publisher | |
| record_format | marcfinc |
| record_id | 473896923 |
| recordtype | marcfinc |
| rvk_facet | No subject assigned |
| source_id | 0 |
| spelling | Dahmen, Tim VerfasserIn aut, Feature adaptive sampling for scanning electron microscopy Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek, 2016, Online-Ressource, Text txt rdacontent, Computermedien c rdamedia, Online-Ressource cr rdacarrier, Engstler, Michael VerfasserIn aut, Pauly, Christoph VerfasserIn aut, Trampert, Patrick VerfasserIn aut, Jonge, Niels de VerfasserIn (DE-588)121263444 (DE-627)730127443 (DE-576)181343908 aut, Mücklich, Frank 1959- VerfasserIn (DE-588)1115732455 (DE-627)869923625 (DE-576)477892973 aut, Slusallek, Philipp 1963- VerfasserIn (DE-588)173023452 (DE-627)697948358 (DE-576)133876411 aut, Leibniz-Institut für Neue Materialien GeistigeR SchöpferIn (DE-588)10123313-9 (DE-627)50534226X (DE-576)250343517 cre, Enthalten in Scientific reports [London] : Macmillan Publishers Limited, part of Springer Nature, 2011 6(2016), Seite 25350 Online-Ressource (DE-627)663366712 (DE-600)2615211-3 (DE-576)346641179 2045-2322 nnns, volume:6 year:2016 pages:25350, http://dx.doi.org/10.1038/srep25350 Verlag kostenfrei Volltext, http://dx.doi.org/10.1038/srep25350 LFER, LFER 2016-10-10T00:00:00Z |
| spellingShingle | Dahmen, Tim, Engstler, Michael, Pauly, Christoph, Trampert, Patrick, Jonge, Niels de, Mücklich, Frank, Slusallek, Philipp, Feature adaptive sampling for scanning electron microscopy |
| swb_id_str | 473896923 |
| title | Feature adaptive sampling for scanning electron microscopy |
| title_auth | Feature adaptive sampling for scanning electron microscopy |
| title_full | Feature adaptive sampling for scanning electron microscopy Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek |
| title_fullStr | Feature adaptive sampling for scanning electron microscopy Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek |
| title_full_unstemmed | Feature adaptive sampling for scanning electron microscopy Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek |
| title_in_hierarchy | Feature adaptive sampling for scanning electron microscopy / Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek, |
| title_short | Feature adaptive sampling for scanning electron microscopy |
| title_sort | feature adaptive sampling for scanning electron microscopy |
| url | http://dx.doi.org/10.1038/srep25350 |