Feature adaptive sampling for scanning electron microscopy

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Published in:	Scientific reports 6(2016), Seite 25350
Authors and Corporations:	Dahmen, Tim (Author), Engstler, Michael (Author), Pauly, Christoph (Author), Trampert, Patrick (Author), Jonge, Niels de (Author), Mücklich, Frank (Author), Slusallek, Philipp (Author), Leibniz-Institut für Neue Materialien (Creator)
Title:	Feature adaptive sampling for scanning electron microscopy/ Tim Dahmen, Michael Engstler, Christoph Pauly, Patrick Trampert, Niels de Jonge, Frank Mücklich & Philipp Slusallek
Type of Resource:	E-Book Component Part
Language:	English
published:	2016
Series:	: Scientific reports, 6(2016), Seite 25350 , volume:6
Source:	Verbunddaten SWB Lizenzfreie Online-Ressourcen