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Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon
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| Zeitschriftentitel: | Advanced Electromagnetics |
|---|---|
| Personen und Körperschaften: | , , , |
| In: | Advanced Electromagnetics, 8, 2019, 2, S. 101-107 |
| Format: | E-Article |
| Sprache: | Unbestimmt |
| veröffentlicht: |
Advanced Electromagnetics
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| Schlagwörter: |
| author_facet |
Yurchenko, V. Navruz, T. S. Ciydem, M. Altintas, A. Yurchenko, V. Navruz, T. S. Ciydem, M. Altintas, A. |
|---|---|
| author |
Yurchenko, V. Navruz, T. S. Ciydem, M. Altintas, A. |
| spellingShingle |
Yurchenko, V. Navruz, T. S. Ciydem, M. Altintas, A. Advanced Electromagnetics Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon Electrical and Electronic Engineering Radiation Electronic, Optical and Magnetic Materials |
| author_sort |
yurchenko, v. |
| spelling |
Yurchenko, V. Navruz, T. S. Ciydem, M. Altintas, A. 2119-0275 Advanced Electromagnetics Electrical and Electronic Engineering Radiation Electronic, Optical and Magnetic Materials http://dx.doi.org/10.7716/aem.v8i2.1127 <jats:p>We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measured the conductivity relaxation times of 10 and 14 microseconds, respectively. In wafers being considered, they are supposed to be defined by the electron-hole diffusion from the bulk to the wafer surfaces.</jats:p> Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon Advanced Electromagnetics |
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Advanced Electromagnetics, 2019 |
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Advanced Electromagnetics, 2019 |
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Advanced Electromagnetics |
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Advanced Electromagnetics |
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| title |
Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_unstemmed |
Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_full |
Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_fullStr |
Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_full_unstemmed |
Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_short |
Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_sort |
microwave whispering-gallery-mode photoconductivity measurement of recombination lifetime in silicon |
| topic |
Electrical and Electronic Engineering Radiation Electronic, Optical and Magnetic Materials |
| url |
http://dx.doi.org/10.7716/aem.v8i2.1127 |
| publishDate |
2019 |
| physical |
101-107 |
| description |
<jats:p>We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measured the conductivity relaxation times of 10 and 14 microseconds, respectively. In wafers being considered, they are supposed to be defined by the electron-hole diffusion from the bulk to the wafer surfaces.</jats:p> |
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| author | Yurchenko, V., Navruz, T. S., Ciydem, M., Altintas, A. |
| author_facet | Yurchenko, V., Navruz, T. S., Ciydem, M., Altintas, A., Yurchenko, V., Navruz, T. S., Ciydem, M., Altintas, A. |
| author_sort | yurchenko, v. |
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| container_title | Advanced Electromagnetics |
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| description | <jats:p>We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measured the conductivity relaxation times of 10 and 14 microseconds, respectively. In wafers being considered, they are supposed to be defined by the electron-hole diffusion from the bulk to the wafer surfaces.</jats:p> |
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| physical | 101-107 |
| publishDate | 2019 |
| publishDateSort | 2019 |
| publisher | Advanced Electromagnetics |
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| recordtype | ai |
| series | Advanced Electromagnetics |
| source_id | 49 |
| spelling | Yurchenko, V. Navruz, T. S. Ciydem, M. Altintas, A. 2119-0275 Advanced Electromagnetics Electrical and Electronic Engineering Radiation Electronic, Optical and Magnetic Materials http://dx.doi.org/10.7716/aem.v8i2.1127 <jats:p>We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measured the conductivity relaxation times of 10 and 14 microseconds, respectively. In wafers being considered, they are supposed to be defined by the electron-hole diffusion from the bulk to the wafer surfaces.</jats:p> Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon Advanced Electromagnetics |
| spellingShingle | Yurchenko, V., Navruz, T. S., Ciydem, M., Altintas, A., Advanced Electromagnetics, Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon, Electrical and Electronic Engineering, Radiation, Electronic, Optical and Magnetic Materials |
| title | Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_full | Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_fullStr | Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_full_unstemmed | Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_short | Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| title_sort | microwave whispering-gallery-mode photoconductivity measurement of recombination lifetime in silicon |
| title_unstemmed | Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon |
| topic | Electrical and Electronic Engineering, Radiation, Electronic, Optical and Magnetic Materials |
| url | http://dx.doi.org/10.7716/aem.v8i2.1127 |