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A novel shadow-imaging technique to measure charge distribution and lattice displacement
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Journal Title: | Journal of Electron Microscopy |
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Authors and Corporations: | |
In: | Journal of Electron Microscopy, 50, 2001, 6, p. 465-471 |
Type of Resource: | E-Article |
Language: | Undetermined |
published: |
Oxford University Press (OUP)
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