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A novel shadow-imaging technique to measure charge distribution and lattice displacement
Gespeichert in:
Zeitschriftentitel: | Journal of Electron Microscopy |
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Personen und Körperschaften: | |
In: | Journal of Electron Microscopy, 50, 2001, 6, S. 465-471 |
Format: | E-Article |
Sprache: | Unbestimmt |
veröffentlicht: |
Oxford University Press (OUP)
|
Schlagwörter: |
author_facet |
Zhu, Y. Zhu, Y. |
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author |
Zhu, Y. |
spellingShingle |
Zhu, Y. Journal of Electron Microscopy A novel shadow-imaging technique to measure charge distribution and lattice displacement Instrumentation General Medicine |
author_sort |
zhu, y. |
spelling |
Zhu, Y. 0022-0744 1460-2393 Oxford University Press (OUP) Instrumentation General Medicine http://dx.doi.org/10.1093/jmicro/50.6.465 A novel shadow-imaging technique to measure charge distribution and lattice displacement Journal of Electron Microscopy |
doi_str_mv |
10.1093/jmicro/50.6.465 |
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Oxford University Press (OUP), 2001 |
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Oxford University Press (OUP), 2001 |
issn |
0022-0744 1460-2393 |
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0022-0744 1460-2393 |
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2001 |
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Oxford University Press (OUP) |
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Journal of Electron Microscopy |
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title |
A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_unstemmed |
A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_full |
A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_fullStr |
A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_full_unstemmed |
A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_short |
A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_sort |
a novel shadow-imaging technique to measure charge distribution and lattice displacement |
topic |
Instrumentation General Medicine |
url |
http://dx.doi.org/10.1093/jmicro/50.6.465 |
publishDate |
2001 |
physical |
465-471 |
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author | Zhu, Y. |
author_facet | Zhu, Y., Zhu, Y. |
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physical | 465-471 |
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series | Journal of Electron Microscopy |
source_id | 49 |
spelling | Zhu, Y. 0022-0744 1460-2393 Oxford University Press (OUP) Instrumentation General Medicine http://dx.doi.org/10.1093/jmicro/50.6.465 A novel shadow-imaging technique to measure charge distribution and lattice displacement Journal of Electron Microscopy |
spellingShingle | Zhu, Y., Journal of Electron Microscopy, A novel shadow-imaging technique to measure charge distribution and lattice displacement, Instrumentation, General Medicine |
title | A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_full | A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_fullStr | A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_full_unstemmed | A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_short | A novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_sort | a novel shadow-imaging technique to measure charge distribution and lattice displacement |
title_unstemmed | A novel shadow-imaging technique to measure charge distribution and lattice displacement |
topic | Instrumentation, General Medicine |
url | http://dx.doi.org/10.1093/jmicro/50.6.465 |