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Analysis on Stress Screening of Components in Digital Background
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| Zeitschriftentitel: | Journal of Physics: Conference Series |
|---|---|
| Personen und Körperschaften: | , , |
| In: | Journal of Physics: Conference Series, 1828, 2021, 1, S. 012100 |
| Format: | E-Article |
| Sprache: | Unbestimmt |
| veröffentlicht: |
IOP Publishing
|
| Schlagwörter: |
| author_facet |
Wei, Juan Sun, Hongbo Chen, Jie Wei, Juan Sun, Hongbo Chen, Jie |
|---|---|
| author |
Wei, Juan Sun, Hongbo Chen, Jie |
| spellingShingle |
Wei, Juan Sun, Hongbo Chen, Jie Journal of Physics: Conference Series Analysis on Stress Screening of Components in Digital Background General Physics and Astronomy |
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wei, juan |
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Wei, Juan Sun, Hongbo Chen, Jie 1742-6588 1742-6596 IOP Publishing General Physics and Astronomy http://dx.doi.org/10.1088/1742-6596/1828/1/012100 <jats:title>Abstract</jats:title> <jats:p>This paper introduces various common defects and corresponding screening methods of electronic components. Aiming at the temperature cycle and random vibration methods with good screening effect, the calculation formula of accelerating factor and screening strength in highly accelerated stress screening (HASS) test is introduced. Based on the above discussion, the stress screening test steps of electronic components are summarized to guide the selection of reasonable stress screening items and levels for electronic components.</jats:p> Analysis on Stress Screening of Components in Digital Background Journal of Physics: Conference Series |
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Journal of Physics: Conference Series |
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| title |
Analysis on Stress Screening of Components in Digital Background |
| title_unstemmed |
Analysis on Stress Screening of Components in Digital Background |
| title_full |
Analysis on Stress Screening of Components in Digital Background |
| title_fullStr |
Analysis on Stress Screening of Components in Digital Background |
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Analysis on Stress Screening of Components in Digital Background |
| title_short |
Analysis on Stress Screening of Components in Digital Background |
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analysis on stress screening of components in digital background |
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General Physics and Astronomy |
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http://dx.doi.org/10.1088/1742-6596/1828/1/012100 |
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2021 |
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012100 |
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<jats:title>Abstract</jats:title>
<jats:p>This paper introduces various common defects and corresponding screening methods of electronic components. Aiming at the temperature cycle and random vibration methods with good screening effect, the calculation formula of accelerating factor and screening strength in highly accelerated stress screening (HASS) test is introduced. Based on the above discussion, the stress screening test steps of electronic components are summarized to guide the selection of reasonable stress screening items and levels for electronic components.</jats:p> |
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| author | Wei, Juan, Sun, Hongbo, Chen, Jie |
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| description | <jats:title>Abstract</jats:title> <jats:p>This paper introduces various common defects and corresponding screening methods of electronic components. Aiming at the temperature cycle and random vibration methods with good screening effect, the calculation formula of accelerating factor and screening strength in highly accelerated stress screening (HASS) test is introduced. Based on the above discussion, the stress screening test steps of electronic components are summarized to guide the selection of reasonable stress screening items and levels for electronic components.</jats:p> |
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| spelling | Wei, Juan Sun, Hongbo Chen, Jie 1742-6588 1742-6596 IOP Publishing General Physics and Astronomy http://dx.doi.org/10.1088/1742-6596/1828/1/012100 <jats:title>Abstract</jats:title> <jats:p>This paper introduces various common defects and corresponding screening methods of electronic components. Aiming at the temperature cycle and random vibration methods with good screening effect, the calculation formula of accelerating factor and screening strength in highly accelerated stress screening (HASS) test is introduced. Based on the above discussion, the stress screening test steps of electronic components are summarized to guide the selection of reasonable stress screening items and levels for electronic components.</jats:p> Analysis on Stress Screening of Components in Digital Background Journal of Physics: Conference Series |
| spellingShingle | Wei, Juan, Sun, Hongbo, Chen, Jie, Journal of Physics: Conference Series, Analysis on Stress Screening of Components in Digital Background, General Physics and Astronomy |
| title | Analysis on Stress Screening of Components in Digital Background |
| title_full | Analysis on Stress Screening of Components in Digital Background |
| title_fullStr | Analysis on Stress Screening of Components in Digital Background |
| title_full_unstemmed | Analysis on Stress Screening of Components in Digital Background |
| title_short | Analysis on Stress Screening of Components in Digital Background |
| title_sort | analysis on stress screening of components in digital background |
| title_unstemmed | Analysis on Stress Screening of Components in Digital Background |
| topic | General Physics and Astronomy |
| url | http://dx.doi.org/10.1088/1742-6596/1828/1/012100 |