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Research on the Radiation Effects and Compact Model of SiGe HBT

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Personen und Körperschaften: Sun, Yabin (VerfasserIn)
Titel: Research on the Radiation Effects and Compact Model of SiGe HBT/ by Yabin Sun
Format: E-Book
Sprache: Englisch
veröffentlicht:
Singapore Springer 2018
Gesamtaufnahme: Springer Theses, Recognizing Outstanding Ph.D. Research
SpringerLink
Springer eBook Collection
Schlagwörter:
Quelle: Verbunddaten SWB
LEADER 03837cam a22008412 4500
001 0-1656969688
003 DE-627
005 20240318091742.0
007 cr uuu---uuuuu
008 171106s2018 si |||||o 00| ||eng c
020 |a 9789811046124  |9 978-981-10-4612-4 
024 7 |a 10.1007/978-981-10-4612-4  |2 doi 
035 |a (DE-627)1656969688 
035 |a (DE-576)495039748 
035 |a (DE-599)BSZ495039748 
035 |a (OCoLC)1015876589 
035 |a (DE-He213)978-981-10-4612-4 
035 |a (EBP)040677532 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
044 |c XB-SG 
050 0 |a TK7800-8360  |a TK7874-7874.9 
050 0 |a TK7800-8360 
050 0 |a TK7874-7874.9 
072 7 |a TEC008070  |2 bisacsh 
072 7 |a TJF  |2 bicssc 
072 7 |a TEC008000  |2 bisacsh 
100 1 |a Sun, Yabin  |0 (DE-588)1137977604  |0 (DE-627)895284936  |0 (DE-576)492302650  |4 aut 
245 1 0 |a Research on the Radiation Effects and Compact Model of SiGe HBT  |c by Yabin Sun 
264 1 |a Singapore  |b Springer  |c 2018 
300 |a Online-Ressource (XXIV, 168 p. 171 illus, online resource) 
336 |a Text  |b txt  |2 rdacontent 
337 |a Computermedien  |b c  |2 rdamedia 
338 |a Online-Ressource  |b cr  |2 rdacarrier 
490 0 |a Springer Theses, Recognizing Outstanding Ph.D. Research 
490 0 |a SpringerLink  |a Bücher 
490 0 |a Springer eBook Collection  |a Engineering 
520 |a This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique 
520 |a Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion 
650 0 |a Engineering 
650 0 |a Solid state physics 
650 0 |a Semiconductors 
650 0 |a Electronic circuits 
650 0 |a Electronics 
650 0 |a Microelectronics 
650 0 |a Optical materials 
650 0 |a Electronic materials 
776 1 |z 9789811046117 
776 0 8 |i Druckausg.  |z 978-981-10-4611-7 
776 0 8 |i Printed edition  |z 9789811046117 
856 4 0 |u https://doi.org/10.1007/978-981-10-4612-4  |m B:SPRINGER  |x Verlag  |z lizenzpflichtig  |3 Volltext 
856 4 2 |u https://swbplus.bsz-bw.de/bsz495039748cov.jpg  |m V:DE-576  |m X:springer  |q image/jpeg  |v 20180119134944  |3 Cover 
889 |w (DE-627)1002539315 
912 |a ZDB-2-ENG  |b 2018 
912 |a ZDB-2-SEB 
912 |a ZDB-2-SXE  |b 2018 
951 |a BO 
900 |a Sun Yabin 
900 |a Yabin, Sun 
951 |b XB-SG 
856 4 0 |u https://doi.org/10.1007/978-981-10-4612-4  |9 DE-14 
852 |a DE-14  |x epn:3421899460  |z 2019-05-09T16:08:22Z 
856 4 0 |u http://dx.doi.org/10.1007/978-981-10-4612-4  |9 DE-Ch1 
852 |a DE-Ch1  |x epn:3390703691  |z 2017-12-07T13:32:00Z 
912 |9 DE-105  |a ZDB-2-ENG 
972 |k Campuslizenz 
972 |c EBOOK 
852 |a DE-105  |x epn:339070390X  |z 2018-03-12T17:30:14Z 
975 |o Springer E-Book 
975 |k Elektronischer Volltext - Campuslizenz 
856 4 0 |u http://dx.doi.org/10.1007/978-981-10-4612-4  |9 DE-Zwi2 
852 |a DE-Zwi2  |x epn:3390704248  |z 2018-01-24T15:45:12Z 
980 |a 1656969688  |b 0  |k 1656969688  |o 495039748 
openURL url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fvufind.svn.sourceforge.net%3Agenerator&rft.title=Research+on+the+Radiation+Effects+and+Compact+Model+of+SiGe+HBT&rft.date=2018&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=book&rft.btitle=Research+on+the+Radiation+Effects+and+Compact+Model+of+SiGe+HBT&rft.series=Springer+Theses%2C+Recognizing+Outstanding+Ph.D.+Research&rft.au=Sun%2C+Yabin&rft.pub=Springer&rft.edition=&rft.isbn=9811046123
SOLR
_version_ 1796700422022365184
author Sun, Yabin
author_facet Sun, Yabin
author_role aut
author_sort Sun, Yabin
author_variant y s ys
callnumber-first T - Technology
callnumber-label TK7800-8360
callnumber-raw TK7800-8360 TK7874-7874.9, TK7800-8360, TK7874-7874.9
callnumber-search TK7800-8360 TK7874-7874.9, TK7800-8360, TK7874-7874.9
callnumber-sort TK 47800 48360 T K7874 47874.9
callnumber-subject TK - Electrical and Nuclear Engineering
collection ZDB-2-ENG, ZDB-2-SEB, ZDB-2-SXE
contents This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique, Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion
ctrlnum (DE-627)1656969688, (DE-576)495039748, (DE-599)BSZ495039748, (OCoLC)1015876589, (DE-He213)978-981-10-4612-4, (EBP)040677532
de105_date 2018-03-12T17:30:14Z
dech1_date 2017-12-07T13:32:00Z
doi_str_mv 10.1007/978-981-10-4612-4
facet_912a ZDB-2-ENG, ZDB-2-SEB, ZDB-2-SXE
facet_avail Online
finc_class_facet Informatik, Technik
finc_id_str 0020683765
format eBook
format_access_txtF_mv Book, E-Book
format_de105 Ebook
format_de14 Book, E-Book
format_de15 Book, E-Book
format_del152 Buch
format_detail_txtF_mv text-online-monograph-independent
format_dezi4 e-Book
format_finc Book, E-Book
format_legacy ElectronicBook
format_legacy_nrw Book, E-Book
format_nrw Book, E-Book
format_strict_txtF_mv E-Book
geogr_code not assigned
geogr_code_person Singapore
id 0-1656969688
illustrated Not Illustrated
imprint Singapore, Springer, 2018
imprint_str_mv Singapore: Springer, 2018
institution DE-14, DE-105, DE-Zwi2, DE-Ch1
is_hierarchy_id
is_hierarchy_title
isbn 9789811046124
isbn_isn_mv 9789811046117, 978-981-10-4611-7
kxp_id_str 1656969688
language English
last_indexed 2024-04-18T19:04:03.599Z
local_heading_facet_dezwi2 Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials
marc024a_ct_mv 10.1007/978-981-10-4612-4
marc_error [geogr_code]Unable to make public java.lang.AbstractStringBuilder java.lang.AbstractStringBuilder.append(java.lang.String) accessible: module java.base does not "opens java.lang" to unnamed module @d9403fb
match_str sun2018researchontheradiationeffectsandcompactmodelofsigehbt
mega_collection Verbunddaten SWB
misc_de105 EBOOK
names_id_str_mv (DE-588)1137977604, (DE-627)895284936, (DE-576)492302650
oclc_num 1015876589
physical Online-Ressource (XXIV, 168 p. 171 illus, online resource)
publishDate 2018
publishDateSort 2018
publishPlace Singapore
publisher Springer
record_format marcfinc
record_id 495039748
recordtype marcfinc
rvk_facet No subject assigned
series2 Springer Theses, Recognizing Outstanding Ph.D. Research, SpringerLink ; Bücher, Springer eBook Collection ; Engineering
source_id 0
spelling Sun, Yabin (DE-588)1137977604 (DE-627)895284936 (DE-576)492302650 aut, Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun, Singapore Springer 2018, Online-Ressource (XXIV, 168 p. 171 illus, online resource), Text txt rdacontent, Computermedien c rdamedia, Online-Ressource cr rdacarrier, Springer Theses, Recognizing Outstanding Ph.D. Research, SpringerLink Bücher, Springer eBook Collection Engineering, This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique, Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion, Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials, 9789811046117, Druckausg. 978-981-10-4611-7, Printed edition 9789811046117, https://doi.org/10.1007/978-981-10-4612-4 B:SPRINGER Verlag lizenzpflichtig Volltext, https://swbplus.bsz-bw.de/bsz495039748cov.jpg V:DE-576 X:springer image/jpeg 20180119134944 Cover, (DE-627)1002539315, https://doi.org/10.1007/978-981-10-4612-4 DE-14, DE-14 epn:3421899460 2019-05-09T16:08:22Z, http://dx.doi.org/10.1007/978-981-10-4612-4 DE-Ch1, DE-Ch1 epn:3390703691 2017-12-07T13:32:00Z, DE-105 epn:339070390X 2018-03-12T17:30:14Z, http://dx.doi.org/10.1007/978-981-10-4612-4 DE-Zwi2, DE-Zwi2 epn:3390704248 2018-01-24T15:45:12Z
spellingShingle Sun, Yabin, Research on the Radiation Effects and Compact Model of SiGe HBT, This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique, Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion, Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials
swb_id_str 495039748
title Research on the Radiation Effects and Compact Model of SiGe HBT
title_auth Research on the Radiation Effects and Compact Model of SiGe HBT
title_full Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun
title_fullStr Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun
title_full_unstemmed Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun
title_short Research on the Radiation Effects and Compact Model of SiGe HBT
title_sort research on the radiation effects and compact model of sige hbt
title_unstemmed Research on the Radiation Effects and Compact Model of SiGe HBT
topic Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials
topic_facet Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials
url https://doi.org/10.1007/978-981-10-4612-4, https://swbplus.bsz-bw.de/bsz495039748cov.jpg, http://dx.doi.org/10.1007/978-981-10-4612-4
work_keys_str_mv AT sunyabin researchontheradiationeffectsandcompactmodelofsigehbt