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Research on the Radiation Effects and Compact Model of SiGe HBT
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Titel: | Research on the Radiation Effects and Compact Model of SiGe HBT/ by Yabin Sun |
Format: | E-Book |
Sprache: | Englisch |
veröffentlicht: |
Singapore
Springer
2018
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Gesamtaufnahme: |
Springer Theses, Recognizing Outstanding Ph.D. Research SpringerLink Springer eBook Collection |
Schlagwörter: | |
Quelle: | Verbunddaten SWB |
LEADER | 03837cam a22008412 4500 | ||
---|---|---|---|
001 | 0-1656969688 | ||
003 | DE-627 | ||
005 | 20240318091742.0 | ||
007 | cr uuu---uuuuu | ||
008 | 171106s2018 si |||||o 00| ||eng c | ||
020 | |a 9789811046124 |9 978-981-10-4612-4 | ||
024 | 7 | |a 10.1007/978-981-10-4612-4 |2 doi | |
035 | |a (DE-627)1656969688 | ||
035 | |a (DE-576)495039748 | ||
035 | |a (DE-599)BSZ495039748 | ||
035 | |a (OCoLC)1015876589 | ||
035 | |a (DE-He213)978-981-10-4612-4 | ||
035 | |a (EBP)040677532 | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
044 | |c XB-SG | ||
050 | 0 | |a TK7800-8360 |a TK7874-7874.9 | |
050 | 0 | |a TK7800-8360 | |
050 | 0 | |a TK7874-7874.9 | |
072 | 7 | |a TEC008070 |2 bisacsh | |
072 | 7 | |a TJF |2 bicssc | |
072 | 7 | |a TEC008000 |2 bisacsh | |
100 | 1 | |a Sun, Yabin |0 (DE-588)1137977604 |0 (DE-627)895284936 |0 (DE-576)492302650 |4 aut | |
245 | 1 | 0 | |a Research on the Radiation Effects and Compact Model of SiGe HBT |c by Yabin Sun |
264 | 1 | |a Singapore |b Springer |c 2018 | |
300 | |a Online-Ressource (XXIV, 168 p. 171 illus, online resource) | ||
336 | |a Text |b txt |2 rdacontent | ||
337 | |a Computermedien |b c |2 rdamedia | ||
338 | |a Online-Ressource |b cr |2 rdacarrier | ||
490 | 0 | |a Springer Theses, Recognizing Outstanding Ph.D. Research | |
490 | 0 | |a SpringerLink |a Bücher | |
490 | 0 | |a Springer eBook Collection |a Engineering | |
520 | |a This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique | ||
520 | |a Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion | ||
650 | 0 | |a Engineering | |
650 | 0 | |a Solid state physics | |
650 | 0 | |a Semiconductors | |
650 | 0 | |a Electronic circuits | |
650 | 0 | |a Electronics | |
650 | 0 | |a Microelectronics | |
650 | 0 | |a Optical materials | |
650 | 0 | |a Electronic materials | |
776 | 1 | |z 9789811046117 | |
776 | 0 | 8 | |i Druckausg. |z 978-981-10-4611-7 |
776 | 0 | 8 | |i Printed edition |z 9789811046117 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-981-10-4612-4 |m B:SPRINGER |x Verlag |z lizenzpflichtig |3 Volltext |
856 | 4 | 2 | |u https://swbplus.bsz-bw.de/bsz495039748cov.jpg |m V:DE-576 |m X:springer |q image/jpeg |v 20180119134944 |3 Cover |
889 | |w (DE-627)1002539315 | ||
912 | |a ZDB-2-ENG |b 2018 | ||
912 | |a ZDB-2-SEB | ||
912 | |a ZDB-2-SXE |b 2018 | ||
951 | |a BO | ||
900 | |a Sun Yabin | ||
900 | |a Yabin, Sun | ||
951 | |b XB-SG | ||
856 | 4 | 0 | |u https://doi.org/10.1007/978-981-10-4612-4 |9 DE-14 |
852 | |a DE-14 |x epn:3421899460 |z 2019-05-09T16:08:22Z | ||
856 | 4 | 0 | |u http://dx.doi.org/10.1007/978-981-10-4612-4 |9 DE-Ch1 |
852 | |a DE-Ch1 |x epn:3390703691 |z 2017-12-07T13:32:00Z | ||
912 | |9 DE-105 |a ZDB-2-ENG | ||
972 | |k Campuslizenz | ||
972 | |c EBOOK | ||
852 | |a DE-105 |x epn:339070390X |z 2018-03-12T17:30:14Z | ||
975 | |o Springer E-Book | ||
975 | |k Elektronischer Volltext - Campuslizenz | ||
856 | 4 | 0 | |u http://dx.doi.org/10.1007/978-981-10-4612-4 |9 DE-Zwi2 |
852 | |a DE-Zwi2 |x epn:3390704248 |z 2018-01-24T15:45:12Z | ||
980 | |a 1656969688 |b 0 |k 1656969688 |o 495039748 |
openURL |
url_ver=Z39.88-2004&ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fvufind.svn.sourceforge.net%3Agenerator&rft.title=Research+on+the+Radiation+Effects+and+Compact+Model+of+SiGe+HBT&rft.date=2018&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=book&rft.btitle=Research+on+the+Radiation+Effects+and+Compact+Model+of+SiGe+HBT&rft.series=Springer+Theses%2C+Recognizing+Outstanding+Ph.D.+Research&rft.au=Sun%2C+Yabin&rft.pub=Springer&rft.edition=&rft.isbn=9811046123 |
---|
_version_ | 1796700422022365184 |
---|---|
author | Sun, Yabin |
author_facet | Sun, Yabin |
author_role | aut |
author_sort | Sun, Yabin |
author_variant | y s ys |
callnumber-first | T - Technology |
callnumber-label | TK7800-8360 |
callnumber-raw | TK7800-8360 TK7874-7874.9, TK7800-8360, TK7874-7874.9 |
callnumber-search | TK7800-8360 TK7874-7874.9, TK7800-8360, TK7874-7874.9 |
callnumber-sort | TK 47800 48360 T K7874 47874.9 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
collection | ZDB-2-ENG, ZDB-2-SEB, ZDB-2-SXE |
contents | This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique, Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion |
ctrlnum | (DE-627)1656969688, (DE-576)495039748, (DE-599)BSZ495039748, (OCoLC)1015876589, (DE-He213)978-981-10-4612-4, (EBP)040677532 |
de105_date | 2018-03-12T17:30:14Z |
dech1_date | 2017-12-07T13:32:00Z |
doi_str_mv | 10.1007/978-981-10-4612-4 |
facet_912a | ZDB-2-ENG, ZDB-2-SEB, ZDB-2-SXE |
facet_avail | Online |
finc_class_facet | Informatik, Technik |
finc_id_str | 0020683765 |
format | eBook |
format_access_txtF_mv | Book, E-Book |
format_de105 | Ebook |
format_de14 | Book, E-Book |
format_de15 | Book, E-Book |
format_del152 | Buch |
format_detail_txtF_mv | text-online-monograph-independent |
format_dezi4 | e-Book |
format_finc | Book, E-Book |
format_legacy | ElectronicBook |
format_legacy_nrw | Book, E-Book |
format_nrw | Book, E-Book |
format_strict_txtF_mv | E-Book |
geogr_code | not assigned |
geogr_code_person | Singapore |
id | 0-1656969688 |
illustrated | Not Illustrated |
imprint | Singapore, Springer, 2018 |
imprint_str_mv | Singapore: Springer, 2018 |
institution | DE-14, DE-105, DE-Zwi2, DE-Ch1 |
is_hierarchy_id | |
is_hierarchy_title | |
isbn | 9789811046124 |
isbn_isn_mv | 9789811046117, 978-981-10-4611-7 |
kxp_id_str | 1656969688 |
language | English |
last_indexed | 2024-04-18T19:04:03.599Z |
local_heading_facet_dezwi2 | Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials |
marc024a_ct_mv | 10.1007/978-981-10-4612-4 |
marc_error | [geogr_code]Unable to make public java.lang.AbstractStringBuilder java.lang.AbstractStringBuilder.append(java.lang.String) accessible: module java.base does not "opens java.lang" to unnamed module @d9403fb |
match_str | sun2018researchontheradiationeffectsandcompactmodelofsigehbt |
mega_collection | Verbunddaten SWB |
misc_de105 | EBOOK |
names_id_str_mv | (DE-588)1137977604, (DE-627)895284936, (DE-576)492302650 |
oclc_num | 1015876589 |
physical | Online-Ressource (XXIV, 168 p. 171 illus, online resource) |
publishDate | 2018 |
publishDateSort | 2018 |
publishPlace | Singapore |
publisher | Springer |
record_format | marcfinc |
record_id | 495039748 |
recordtype | marcfinc |
rvk_facet | No subject assigned |
series2 | Springer Theses, Recognizing Outstanding Ph.D. Research, SpringerLink ; Bücher, Springer eBook Collection ; Engineering |
source_id | 0 |
spelling | Sun, Yabin (DE-588)1137977604 (DE-627)895284936 (DE-576)492302650 aut, Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun, Singapore Springer 2018, Online-Ressource (XXIV, 168 p. 171 illus, online resource), Text txt rdacontent, Computermedien c rdamedia, Online-Ressource cr rdacarrier, Springer Theses, Recognizing Outstanding Ph.D. Research, SpringerLink Bücher, Springer eBook Collection Engineering, This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique, Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion, Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials, 9789811046117, Druckausg. 978-981-10-4611-7, Printed edition 9789811046117, https://doi.org/10.1007/978-981-10-4612-4 B:SPRINGER Verlag lizenzpflichtig Volltext, https://swbplus.bsz-bw.de/bsz495039748cov.jpg V:DE-576 X:springer image/jpeg 20180119134944 Cover, (DE-627)1002539315, https://doi.org/10.1007/978-981-10-4612-4 DE-14, DE-14 epn:3421899460 2019-05-09T16:08:22Z, http://dx.doi.org/10.1007/978-981-10-4612-4 DE-Ch1, DE-Ch1 epn:3390703691 2017-12-07T13:32:00Z, DE-105 epn:339070390X 2018-03-12T17:30:14Z, http://dx.doi.org/10.1007/978-981-10-4612-4 DE-Zwi2, DE-Zwi2 epn:3390704248 2018-01-24T15:45:12Z |
spellingShingle | Sun, Yabin, Research on the Radiation Effects and Compact Model of SiGe HBT, This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique, Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion, Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials |
swb_id_str | 495039748 |
title | Research on the Radiation Effects and Compact Model of SiGe HBT |
title_auth | Research on the Radiation Effects and Compact Model of SiGe HBT |
title_full | Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun |
title_fullStr | Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun |
title_full_unstemmed | Research on the Radiation Effects and Compact Model of SiGe HBT by Yabin Sun |
title_short | Research on the Radiation Effects and Compact Model of SiGe HBT |
title_sort | research on the radiation effects and compact model of sige hbt |
title_unstemmed | Research on the Radiation Effects and Compact Model of SiGe HBT |
topic | Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials |
topic_facet | Engineering, Solid state physics, Semiconductors, Electronic circuits, Electronics, Microelectronics, Optical materials, Electronic materials |
url | https://doi.org/10.1007/978-981-10-4612-4, https://swbplus.bsz-bw.de/bsz495039748cov.jpg, http://dx.doi.org/10.1007/978-981-10-4612-4 |
work_keys_str_mv | AT sunyabin researchontheradiationeffectsandcompactmodelofsigehbt |