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Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range

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Veröffentlicht in: Procedia engineering 19(2011), Seite 235-240
Personen und Körperschaften: Kruse, D. (VerfasserIn), Patzelt, S. (VerfasserIn), Dollinger, C. (VerfasserIn), Tausendfreund, A. (VerfasserIn), Goch, G. (VerfasserIn)
Titel: Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range/ D. Kruse; S. Patzelt; C. Dollinger; A. Tausendfreund; G. Goch;
Format: E-Book-Kapitel
Sprache: Englisch
veröffentlicht:
2011
Gesamtaufnahme: : Procedia engineering, 19(2011), Seite 235-240
, year:2011
Quelle: Verbunddaten SWB
Lizenzfreie Online-Ressourcen
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spelling Kruse, D. VerfasserIn aut, Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range D. Kruse; S. Patzelt; C. Dollinger; A. Tausendfreund; G. Goch;, 2011, Text txt rdacontent, Computermedien c rdamedia, Online-Ressource cr rdacarrier, Patzelt, S. VerfasserIn aut, Dollinger, C. VerfasserIn aut, Tausendfreund, A. VerfasserIn aut, Goch, G. VerfasserIn aut, Enthalten in Procedia engineering Amsterdam [u.a.] : Elsevier, 2009 19(2011), Seite 235-240 Online-Ressource (DE-627)607348992 (DE-600)2509658-8 (DE-576)310099773 1877-7058 nnns, year:2011 volume:19 pages:235-240, http://dx.doi.org/10.1016/j.proeng.2011.11.106 Resolving-System kostenfrei Volltext, http://dx.doi.org/10.1016/j.proeng.2011.11.106 LFER, LFER 2019-07-22T00:00:00Z
spellingShingle Kruse, D., Patzelt, S., Dollinger, C., Tausendfreund, A., Goch, G., Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range
swb_id_str 9853825449
title Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range
title_auth Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range
title_full Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range D. Kruse; S. Patzelt; C. Dollinger; A. Tausendfreund; G. Goch;
title_fullStr Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range D. Kruse; S. Patzelt; C. Dollinger; A. Tausendfreund; G. Goch;
title_full_unstemmed Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range D. Kruse; S. Patzelt; C. Dollinger; A. Tausendfreund; G. Goch;
title_in_hierarchy Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range / D. Kruse; S. Patzelt; C. Dollinger; A. Tausendfreund; G. Goch;,
title_short Laser Optical Characterization of Smooth Surfaces with Respect to Roughness and Defects in the Micrometer Range
title_sort laser optical characterization of smooth surfaces with respect to roughness and defects in the micrometer range
url http://dx.doi.org/10.1016/j.proeng.2011.11.106