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16th International Conference on Microscopy of Semiconducting Materials, 17 -20 March 2009, University of Oxford, United Kingdom: this volume contains invited and contributed paper...
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Titel: | 16th International Conference on Microscopy of Semiconducting Materials, 17 -20 March 2009, University of Oxford, United Kingdom: this volume contains invited and contributed papers ; held at the University of Oxford |
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Format: | E-Book Konferenzbericht |
Sprache: | Englisch |
veröffentlicht: |
Bristol
IOP Publ.
2010
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Gesamtaufnahme: |
Journal of physics / Conference Series ; 209
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Schlagwörter: | |
CD-ROM-Ausg.: | 16th International Conference on Microscopy of Semiconducting Materials, [S.l.] : IOP Publ., 2009, 1 CD-ROM |
Quelle: | Verbunddaten SWB Lizenzfreie Online-Ressourcen |
Umfang: | Online-Ressource |
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